関 岳人 / Takehito Seki




東京大学 大学院工学系研究科 総合研究機構 助教
科学技術振興機構 さきがけ研究者

  113-8656 東京都文京区弥生2ｰ11ｰ16 工学部9号館
  Phone 03-5841-7689
  Fax 03-5841-7694
  mail: seki[at]sigma.t.u-tokyo.ac.jp



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  • 電子顕微鏡材料学研究室
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  • Invited Talks
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    • Profile



    • 2021年10月 - 現在　　　　 　　JSTさきがけ研究者（兼任）
    • 2019年 4月  - 現在　　　　 　　東京大学大学院 工学系研究科総合研究機構 助教
    • 2015年 4月  - 2019年3月　  東京大学大学院 工学系研究科総合研究機構 特任研究員
    • 2014年 4月  - 2015年3月　  東京大学大学院 工学系研究科マテリアル工学専攻
          日本学術振興会特別研究員(PD)
    • 2013年 4月  - 2014年3月　  東京大学大学院 工学系研究科マテリアル工学専攻
          日本学術振興会特別研究員(DC2)
    • 2014年 3月  　　　　　　　　　　 東京大学大学院 工学系研究科マテリアル工学専攻 博士課程修了
          博士（工学）




    Research



    分割型検出器を用いた新規STEM結像手法開発

    複雑構造金属間化合物に関する研究





    Publication list



    Peer Review Papers

    1. S. Toyama, T. Seki, Y. Kanitani, Y. Kudo, S. Tomiya, Y. Ikuhara, N. Shibata, "Real-space observation of a two-dimensional electron gas at semiconductor heterointerfaces",
      Nature Nanotechnology .

    2. T. Seki, K. Khare, Y. O. Murakami, S. Toyama, G. Sánchez-Santolino, H. Sasaki, S. D. Findlay, T. C. Petersen, Y. Ikuhara, N. Shibata, "Linear imaging theory for differential phase contrast and other phase imaging modes in scanning transmission electron microscopy",
      Ultramicroscopy 240 (2022) 113580.

    3. S. Toyama, T. Seki, Y. Kanitani, Y. Kudo, S. Tomiya, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM",
      Ultramicroscopy 238 (2022) 113538.

    4. T. Mawson, D. Taplin, H. Brown, L. Clark, R. Ishikawa, T. Seki, Y. Ikuhara, N. Shibata, D. Paganin, M. Morgan, M. Weyland, T. Petersen, S. Findlay, "Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector",
      Ultramicroscopy 233 (2022) 113457.

    5. Y. Kohno, T. Seki, S. D. Findlay, Y. Ikuhara, N. Shibata, "Real-space visualization of intrinsic magnetic fields of an antiferromagnet",
      Nature 602 (2022) 234-239.

    6. R. Tamura, A. Ishikawa, S. Suzuki, T. Kotajima, Y. Tanaka, T. Seki, N. Shibata, T. Yamada, T. Fujii, C. Wang, M. Avdeev, K. Nawa, D. Okuyama, T. J. Sato, "Experimental Observation of Long-Range Magnetic Order in Icosahedral Quasicrystals",
      Journal of the American Chemical Society 143 (2021) 19938-19944.

    7. T. Seki, Y. Ikuhara, N. Shibata, "Toward quantitative electromagnetic field imaging by differential-phase-contrast scanning transmission electron microscopy",
      Microscopy 70 (2021) 148-160.

    8. D. G. Hopkinson, T. Seki, N. Clark, R. Chen, Y. Zou, A. Kimura, R. V. Gorbachev, T. Thomson, N. Shibata, S. J. Haigh, "Nanometre imaging of Fe3GeTe2 ferromagnetic domain walls",
      Nanotechnology 32 (2021) 205703.

    9. H. Zeng, T. Takahashi, T. Seki, M. Kanai, G. Zhang, T. Hosomi, K. Nagashima, N. Shibata, T. Yanagida, "Oxygen-Induced Reversible Sn-Dopant Deactivation between Indium Tin Oxide and Single-Crystalline Oxide Nanowire Leading to Interfacial Switching",
      ACS Applied Materials & Interfaces 12 (2020) 52929-52936.

    10. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio",
      Ultramicroscopy 220 (2021) 113133.

    11. Y. O. Murakami, T. Seki, A. Kinoshita, T. Shoji, Y. Ikuhara, N. Shibata, "Magnetic-structure imaging in polycrystalline materials by specimen-tilt series averaged DPC STEM",
      Microscopy 69 (2020) 312-320.

    12. S. Toyama, T. Seki, S. Anada, H. Sasaki, K. Yamamoto, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping of a p–n junction by DPC STEM",
      Ultramicroscopy 216 (2020) 113033.

    13. K. Nakamura, T. Takahashi, T. Hosomi, T. Seki, M. Kanai, G. Zhang, K. Nagashima, N. Shibata, T. Yanagida, "Redox-Inactive CO2 Determines Atmospheric Stability of Electrical Properties of ZnO Nanowire Devices through a Room-Temperature Surface Reaction",
      ACS Applied Materials & Interfaces 11 (2019) 40260-40266.

    14. N. Shibata, Y. Kohno, A. Nakamura, S. Morishita, T. Seki, A. Kumamoto, H. Sawada, T. Matsumoto, S. D. Findlay, Y. Ikuhara, "Atomic resolution electron microscopy in a magnetic field free environment",
      Nature Communications 10 (2019) 2308.

    15. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "High contrast STEM imaging for light elements by an annular segmented detector"
      Ultramicroscopy 202 (2019) 148-155.

    16. H. Anzai, T. Takahashi, M. Suzuki, M. Kanai, G. Zhang, T. Hosomi, T. Seki, K. Nagashima, N. Shibata, T. Yanagida, "Unusual Oxygen Partial Pressure Dependence of Electrical Transport of Single-Crystalline Metal Oxide Nanowires Grown by the Vapor–Liquid–Solid Process"
      Nano Letters 19 (2019) 1675-1681.

    17. R. Ishikawa, S.D. Findlay, T. Seki, G. Sanchez-Santlino, Y. Kohno, Y. Ikuhara, N. Shibata, "Direct electric field imaging of graphene defects"
      Nature Communications 9 (2018) 3878.

    18. G. Sánchez-Santolino, N.R. Lugg, T. Seki, R. Ishikawa, S.D. Findlay, Y. Kohno, Y. Kanitani, S. Tanaka, S. Tomiya, Y. Ikuhara, N. Shibata, "Probing the Internal Atomic Charge Density Distributions in Real Space"
      ACS Nano 12 (2018) 8875–8881.

    19. T. Seki, N. Takanashi, E. Abe, "Integrated contrast-treansfer-function for aberration-corrected phase-contrast"
      Ultramicroscopy 194 (2018) 193-198.

    20. T. Seki, Y. Ikuhara, N. Shibata,"Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy"
      Ultramicroscopy 193 (2018) 118-125.

    21. C. Chen, H. Li, T. Seki, D. Yin, G. Sanchez-Santolino, K. Inoue, N. Shibata, Y. Ikuhara,"Direct Determination of Atomic Structure and Magnetic Coupling of Magnetite Twin Boundaries"
      ACS Nano 12 (2018) 2662-2668.

    22. N. Shibata, S.D. Findlay, T. Matsumoto, Y. Kohno, T. Seki, G. Sánchez-Santolino, Y. Ikuhara, "Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy"
      Accounts of Chemical Research 50 (2017) 1502.

    23. A.Ishizuka, M. Oka, T. Seki, N. Shibata, K. Ishizuka,"Boundary-artifact-free determination of potential distribution from differential phase contrast signals"
      Microscopy 66 (2017) 397-405.

    24. T. Seki, G.S. Santolino, R. Ishikawa, S.D. Findlay, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping in thin specimens using a segmented detector: revisiting the transfer function for differential phase contrast"
      Ultramicroscopy 182 (2017) 258.

    25. H. Anzai, M. Suzuki, K. Nagashima, M. Kanai, Z. Zhu, Y. He, M. Boudot, G. Zhang, T. Takahashi, K. Kanemoto, T.Seki, N. Shibata, T. Yanagida, "True Vapor–Liquid–Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires"
      Nano Letters 17 (2017) 4698.

    26. N. Shibata, T. Seki, G.S. Santolino, S.D. Findlay, Y. Kohno, T. Matsumoto, R. Ishikawa, Y. Ikuhara, "Electric field imaging of single atoms"
      Nature Communications 8 (2017) 15631.

    27. T. Seki, E. Abe, "Local cluster symmetry of a highly ordered quasicrystalline Al58Cu26Ir16 extracted through multivariate analysis of STEM images",
      Microscopy 64 (2015) 241.

    Review Articles

    1. 関 岳人, 河野 祐二, 幾原 雄一, 柴田 直哉, "走査透過電子顕微鏡による原子レベルの磁場観察",
      固体物理 58 (2023) 21-27.

    2. 河野 祐二, 関 岳人, 森下 茂幸, 柴田 直哉, "原子分解能磁場フリー電子顕微鏡の開発と原子磁場観察",
      顕微鏡 57 (2022) 131-138.

    3. 馮 斌, 魏 家科, 石川 亮, 関 岳人, 柴田 直哉, 幾原 雄一, "機能コアにおける先端電子顕微鏡解析",
      まてりあ 61 (2022) 640-644.

    4. 大江 耕介, 関 岳人, 河野 祐二, 中村 明穂, 幾原 雄一, 柴田 直哉, "OBF STEM法を利用した低ドーズ原子分解能観察",
      顕微鏡 57 (2022) 49-53.

    5. 遠山 慧子, 関 岳人, 蟹谷 裕也, 冨谷 茂隆, 幾原 雄一, 柴田 直哉, "微分位相コントラストSTEMを用いたGaN/AlGaN/InGaNマルチヘテロ接合の局所電場観察",
      電気学会論文誌C（電子・情報・システム部門誌） 142 (2022) 367-372.

    6. 関 岳人, Sánchez-Santolino Gabriel, 石川亮, 幾原雄一, 柴田直哉, "原子分解能微分位相コントラストSTEM法の理論",
      顕微鏡 52 (2017) 8.

    7. E. Abe, D. Egusa, R. Ishikawa and T. Seki, "Ultrahigh-Resolution STEM Analysis of Complex Compounds",
      JEOL News 45 (2010) 20.

    Conference Proceedings

    1. S. Findlay, L. Allen, H. Brown, Z. Chen, J. Ciston, Y. Ikuhara, R. Ishikawa, C. Ophus, G. Sánchez-Santolino, T. Seki, N. Shibata, M. Weyland, "Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't",
      Microscopy and Microanalysis 26 (2020) 442-443.

    2. Y. O. Murakami, T. Seki, A. Kinoshita, T. Shoji, Y. Ikuhara, N. Shibata, "New Magnetic Structure Imaging Techniques in Polycrystalline Materials by DPC STEM",
      Microscopy, 68, (2019), i36..

    3. T. Seki, Y. Ikuhara, N. Shibata, "Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens",
      Microscopy and Microanalysis 25 (2019) 60-61.

    4. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Light Element Imaging Technique at Low Dose Condition by Processing Simultaneously Obtained STEM Images Using a Segmented Detector",
      Microscopy and Microanalysis 25 (2019) 484-485.

    5. T. Seki, Y. Ikuhara, N. Shibata, "Iterative Potential Reconstruction Method based on DPC signal from thick specimens",
      AMTC Letters 6 (2019) 46-47.

    6. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Low Dose STEM Imaging Technique for Light Element Atoms by Processing Images Simultaneously Obtained by a Segmented Detector",
      AMTC Letters 6 (2019) 25-27.

    7. S. Toyama, T. Seki, H. Sasaki, Y. Ikuhara, N. Shibata, "Electric field quantification method for a p-n junction by DPC STEM",
      AMTC Letters 6 (2019) 20-21.

    8. Y. Murakami, T. Seki, A. Kinoshita, T. Shoji, Y. Ikuhara, N. Shibata, "Development of Magnetic Structure Imaging Techniques in Polycrystalline Materials by DPC STEM",
      AMTC Letters 6 (2019) 48-49.

    9. T. Seki, G.S. Santolino, R. Ishikawa, Y. Ikuhara, N. Shibata, "Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors"
      Microscopy and Microanalysis 23 (2017) 440.

    10. A. Ishizuka, M. Oka, K. Ishizuka, T. Seki, N. Shibata, "Numerical Procedures to determine Potential Distribution from Electronic Field Vectors observed in Differential Phase Contrast (DPC) imaging",
      Microscopy and Microanalysis 23 (2017) 34-35.

    11. G. Sanchez-Santolino, T. Seki, N. Lugg, R. Ishikawa, D. J. Taplin, S. D. Findlay, Y. Ikuhara, N. Shibata, "Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector",
      Microscopy and Microanalysis 22 (2016) 504-505.

    12. N. Shibata, S. Findlay, T. Matsumoto, T. Seki, G. Sánchez-Santolino, Y. Kohno, H. Sawada, H. Sasaki, Y. So, R. Ishikawa, Y. Ikuhara, "Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy",
      Microscopy and Microanalysis 22 (2016) 906-907.

    13. G. Sanchez-Santolino, T. Seki, N.R. Lugg, R. Ishikawa, D.J. Taplin, S.D. Findlay, Y. Ikuhara, N. Shibata "Characterization of Electromagnetic Fields by Atomic Resolution Differential Phase Contrast Scanning Transmission Electron Microscopy",
      AMTC Letters 5 (2016) 242-243.

    14. D. J. Taplin, R. Ishikawa, T. Seki, H. Sawada, M. Weyland, N. Shibata, S. D. Findlay, "Differential Phase Contrast Imaging using a Segmented Detector",
      AMTC Letters 5 (2016) 24-25.

    15. T. Seki, E. Abe, "Direct observations of local electronic states in an Al-based quasicrystal by STEM-EELS",
      Microscopy 63 (2014) i17.

    16. T. Seki, E. Abe and S.J. Pennycook, "Quantitative Analysis of Point Defects in an Ideal Quasicrystal with Aberration- Corrected STEM and First-Principles Calculations”,
      AMTC Letters 2 (2010) 194.

    17. E. Abe, T. Seki, S. Pennycook, "Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM",
      Microscopy and Microanalysis 15 (2009) 772-773.

    Invited Talks

    1. 関岳人, 「DPC STEMによる機能コアの高分解能電磁場観察」
      新学術領域研究「機能コアの材料科学」若手講演会, 2023年8月1日.

    2. T. Seki, N. Shibata, "Advanced Phase Imaging in Scanning Transmission Electron Microscopy"
      International Union of Microbeam Analysis Societies, 2023年6月15日.

    3. T. Seki, N. Shibata, "Direct Electromagnetic Field Imaging at Defects by Differential Phase Contrast Scanning Transmission Electron Microscopy"
      4th Japan-Canada Microscopy Societies Workshop, 2023年6月11日.

    4. 関岳人, 「分割型検出器を用いたSTEM法の開発と応用」
      日本顕微鏡学会関東支部講演会, 2023年3月7日.

    5. 関岳人, 「無磁場原子分解能STEMによる原子・磁気構造解析」
      日本顕微鏡学会超高分解能顕微鏡法分科会, 2023年3月3日.

    6. 関岳人, 「走査透過電子顕微鏡法の開発とハイパーマテリアルへの応用」
      第27回ハイパーマテリアルセミナー, 2023年1月12日.

    7. T. Seki, Y. Ikuhara, N. Shibata, "Theory and Applications of Phase Imaging in STEM Using a Segmented Detector"
      日本顕微鏡学会学術講演会, 2022年5月10日.

    8. T. Seki, K. Ooe, Y. Ikuhara, N. Shibata, "Ultra-high contrast imaging in scanning transmission electron microscopy"
      Monash/Melbourne Imaging and Optical Physics Seminar, 2021年7月13日

    9. 関岳人, 幾原雄一, 柴田直哉, 「STEM 位相法の理論と応用」
      日本顕微鏡学会学術講演会, 2021年6月16日.

    10. 関岳人, 幾原雄一, 柴田直哉, 「STEM 位相イメージングの理論と応用」
      日本顕微鏡学会第63回シンポジウム, 2020年11月20日.

    11. 関岳人, Sánchez-Santolino Gabriel, 石川 亮, Findlay Scott D., 幾原 雄一, 柴田 直哉, 「DPCによる電磁場定量法の基礎 」
      日本顕微鏡学会分析電子顕微鏡討論会, 2019年9月3日.

    12. 関岳人, 幾原雄一, 柴田直哉, 「DPC STEMによる反復ポテンシャル再生法」
      日本顕微鏡学会学術講演会, 2018年5月31日.

    13. 関岳人, G. Sánchez-Santolino, 石川亮, S.D. Findlay, 幾原雄一, 柴田直哉, 「微分位相コントラスト法による電磁場定量の現状と展望」
      日本顕微鏡学会超高分解能顕微鏡法分科会研究会, 2018年2月24日.

    Awards

    1. 2023年3月, 準結晶研究会 蔡安邦賞（若手研究者の部）

    2. 2022年5月, 日本顕微鏡学会奨励賞

    3. 2021年3月, 風戸研究奨励会 風戸研究奨励賞.

    4. 2019年5月, 日本顕微鏡学会論文賞 顕微鏡法基礎部門.

    5. 2017年5月, 日本顕微鏡学会論文賞 応用研究 非生物部門.

    6. 2013年9月, Best Poster Prize, 12th International Conference on Quasicrystals.

    7. 2011年5月, Young Scientist Award, The 6th Asian International Workshop on Quasicrystal.


    Patents

    1. 特願2023-101824 走査型透過電子顕微鏡による測定方法、走査型透過電子顕微鏡システム及びプログラム, 関 岳人, 柴田 直哉, 埜上満, 大江 耕介, 幾原 雄一

    2. 特開2021-077523 走査型透過電子顕微鏡による観察方法、走査型透過電子顕微鏡システム及びプログラム, 柴田 直哉, 関 岳人, 大江 耕介, 幾原 雄一