Takehito Seki




Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
Phone +81-3-5841-7689
Fax +81-3-5841-7694
mail: seki     sigma.t.u-tokyo.ac.jp(please insert @ instead of space)



Contents

  • Profile
  • Research
  • Publication list




    • Profile



    • 2019年4月 - 現在　　　　 東京大学大学院 工学系研究科総合研究機構 助教
    • 2015年4月 - 2019年3月　東京大学大学院 工学系研究科総合研究機構 特任研究員
    • 2014年4月 - 2015年3月　東京大学大学院 工学系研究科マテリアル工学専攻
        日本学術振興会特別研究員(PD)
    • 2013年4月 - 2014年3月　東京大学大学院 工学系研究科マテリアル工学専攻
        日本学術振興会特別研究員(DC2)
    • 2014年3月 　　　　　　　東京大学大学院 工学系研究科マテリアル工学専攻 博士課程修了
        博士（工学）


    Research



    分割型検出器を用いた新規STEM結像手法開発

    複雑構造金属間化合物に関する研究





    Publication list



    Peer Review Papers

    1. T. Seki, Y. Ikuhara, N. Shibata, "Toward quantitative electromagnetic field imaging by differential-phase-contrast scanning transmission electron microscopy",
      Microscopy 70 (2021) 148-160.

    2. D. G. Hopkinson, T. Seki, N. Clark, R. Chen, Y. Zou, A. Kimura, R. V. Gorbachev, T. Thomson, N. Shibata, S. J. Haigh, "Nanometre imaging of Fe3GeTe2 ferromagnetic domain walls",
      Nanotechnology 32 (2021) 205703.

    3. H. Zeng, T. Takahashi, T. Seki, M. Kanai, G. Zhang, T. Hosomi, K. Nagashima, N. Shibata, T. Yanagida, "Oxygen-Induced Reversible Sn-Dopant Deactivation between Indium Tin Oxide and Single-Crystalline Oxide Nanowire Leading to Interfacial Switching",
      ACS Applied Materials & Interfaces 12 (2020) 52929-52936.

    4. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio",
      Ultramicroscopy 220 (2021) 113133.

    5. Y. O. Murakami, T. Seki, A. Kinoshita, T. Shoji, Y. Ikuhara, N. Shibata, "Magnetic-structure imaging in polycrystalline materials by specimen-tilt series averaged DPC STEM",
      Microscopy 69 (2020) 312-320.

    6. S. Toyama, T. Seki, S. Anada, H. Sasaki, K. Yamamoto, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping of a p–n junction by DPC STEM",
      Ultramicroscopy 216 (2020) 113033.

    7. K. Nakamura, T. Takahashi, T. Hosomi, T. Seki, M. Kanai, G. Zhang, K. Nagashima, N. Shibata, T. Yanagida, "Redox-Inactive CO2 Determines Atmospheric Stability of Electrical Properties of ZnO Nanowire Devices through a Room-Temperature Surface Reaction",
      ACS Applied Materials & Interfaces 11 (2019) 40260-40266.

    8. N. Shibata, Y. Kohno, A. Nakamura, S. Morishita, T. Seki, A. Kumamoto, H. Sawada, T. Matsumoto, S. D. Findlay, Y. Ikuhara, "Atomic resolution electron microscopy in a magnetic field free environment",
      Nature Communications 10 (2019) 2308.

    9. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "High contrast STEM imaging for light elements by an annular segmented detector"
      Ultramicroscopy 202 (2019) 148-155.

    10. H. Anzai, T. Takahashi, M. Suzuki, M. Kanai, G. Zhang, T. Hosomi, T. Seki, K. Nagashima, N. Shibata, T. Yanagida, "Unusual Oxygen Partial Pressure Dependence of Electrical Transport of Single-Crystalline Metal Oxide Nanowires Grown by the Vapor–Liquid–Solid Process"
      Nano Letters 19 (2019) 1675-1681.

    11. R. Ishikawa, S.D. Findlay, T. Seki, G. Sanchez-Santlino, Y. Kohno, Y. Ikuhara, N. Shibata, "Direct electric field imaging of graphene defects"
      Nature Communications 9 (2018) 3878.

    12. G. Sánchez-Santolino, N.R. Lugg, T. Seki, R. Ishikawa, S.D. Findlay, Y. Kohno, Y. Kanitani, S. Tanaka, S. Tomiya, Y. Ikuhara, N. Shibata, "Probing the Internal Atomic Charge Density Distributions in Real Space"
      ACS Nano 12 (2018) 8875–8881.

    13. T. Seki, N. Takanashi, E. Abe, "Integrated contrast-treansfer-function for aberration-corrected phase-contrast"
      Ultramicroscopy 194 (2018) 193-198.

    14. T. Seki, Y. Ikuhara, N. Shibata,"Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy"
      Ultramicroscopy 193 (2018) 118-125.

    15. C. Chen, H. Li, T. Seki, D. Yin, G. Sanchez-Santolino, K. Inoue, N. Shibata, Y. Ikuhara,"Direct Determination of Atomic Structure and Magnetic Coupling of Magnetite Twin Boundaries"
      ACS Nano 12 (2018) 2662-2668.

    16. N. Shibata, S.D. Findlay, T. Matsumoto, Y. Kohno, T. Seki, G. Sánchez-Santolino, Y. Ikuhara, "Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy"
      Accounts of Chemical Research 50 (2017) 1502.

    17. A.Ishizuka, M. Oka, T. Seki, N. Shibata, K. Ishizuka,"Boundary-artifact-free determination of potential distribution from differential phase contrast signals"
      Microscopy 66 (2017) 397-405.

    18. T. Seki, G.S. Santolino, R. Ishikawa, S.D. Findlay, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping in thin specimens using a segmented detector: revisiting the transfer function for differential phase contrast"
      Ultramicroscopy 182 (2017) 258.

    19. H. Anzai, M. Suzuki, K. Nagashima, M. Kanai, Z. Zhu, Y. He, M. Boudot, G. Zhang, T. Takahashi, K. Kanemoto, T.Seki, N. Shibata, T. Yanagida, "True Vapor–Liquid–Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires"
      Nano Letters 17 (2017) 4698.

    20. N. Shibata, T. Seki, G.S. Santolino, S.D. Findlay, Y. Kohno, T. Matsumoto, R. Ishikawa, Y. Ikuhara, "Electric field imaging of single atoms"
      Nature Communications 8 (2017) 15631.

    21. T. Seki, E. Abe, "Local cluster symmetry of a highly ordered quasicrystalline Al58Cu26Ir16 extracted through multivariate analysis of STEM images",
      Microscopy 64 (2015) 241.

    Review Articles

    1. 関岳人, Sánchez-Santolino Gabriel, 石川亮, 幾原雄一, 柴田直哉, "原子分解能微分位相コントラストSTEM法の理論",
      顕微鏡 52 (2017) 8.

    2. E. Abe, D. Egusa, R. Ishikawa and T. Seki, "Ultrahigh-Resolution STEM Analysis of Complex Compounds",
      JEOL News 45 (2010) 20.

    Conference Proceedings

    1. S. Findlay, L. Allen, H. Brown, Z. Chen, J. Ciston, Y. Ikuhara, R. Ishikawa, C. Ophus, G. Sánchez-Santolino, T. Seki, N. Shibata, M. Weyland, "Phase-Contrast-Based Structure Retrieval Methods in Atomic Resolution Scanning Transmission Electron Microscopy – When They Hold and When They Don't",
      Microscopy and Microanalysis 26 (2020) 442-443.

    2. T. Seki, Y. Ikuhara, N. Shibata, "Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens",
      Microscopy and Microanalysis 25 (2019) 60-61.

    3. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Light Element Imaging Technique at Low Dose Condition by Processing Simultaneously Obtained STEM Images Using a Segmented Detector",
      Microscopy and Microanalysis 25 (2019) 484-485.

    4. T. Seki, Y. Ikuhara, N. Shibata, "Iterative Potential Reconstruction Method based on DPC signal from thick specimens",
      AMTC Letters 6 (2019) 20-21.

    5. K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Low Dose STEM Imaging Technique for Light Element Atoms by Processing Images Simultaneously Obtained by a Segmented Detector",
      AMTC Letters 6 (2019) 25-27.

    6. S. Toyama, T. Seki, H. Sasaki, Y. Ikuhara, N. Shibata, "Electric field quantification method for a p-n junction by DPC STEM",
      AMTC Letters 6 (2019) 20-21.

    7. Y. Murakami, T. Seki, A. Kinoshita, T. Shoji, Y. Ikuhara, N. Shibata, "Development of Magnetic Structure Imaging Techniques in Polycrystalline Materials by DPC STEM",
      AMTC Letters 6 (2019) 48-49.

    8. T. Seki, G.S. Santolino, R. Ishikawa, Y. Ikuhara, N. Shibata, "Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors"
      Microscopy and Microanalysis 23 (2017) 440.

    9. A. Ishizuka, M. Oka, K. Ishizuka, T. Seki, N. Shibata, "Numerical Procedures to determine Potential Distribution from Electronic Field Vectors observed in Differential Phase Contrast (DPC) imaging",
      Microscopy and Microanalysis 23 (2017) 34-35.

    10. G. Sanchez-Santolino, T. Seki, N. Lugg, R. Ishikawa, D. J. Taplin, S. D. Findlay, Y. Ikuhara, N. Shibata, "Quantitative Atomic Resolution Differential Phase Contrast Imaging Using a Segmented Area All Field Detector",
      Microscopy and Microanalysis 22 (2016) 504-505.

    11. N. Shibata, S. Findlay, T. Matsumoto, T. Seki, G. Sánchez-Santolino, Y. Kohno, H. Sawada, H. Sasaki, Y. So, R. Ishikawa, Y. Ikuhara, "Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy",
      Microscopy and Microanalysis 22 (2016) 906-907.

    12. G. Sanchez-Santolino, T. Seki, N.R. Lugg, R. Ishikawa, D.J. Taplin, S.D. Findlay, Y. Ikuhara, N. Shibata "Characterization of Electromagnetic Fields by Atomic Resolution Differential Phase Contrast Scanning Transmission Electron Microscopy",
      AMTC Letters 5 (2016) 242-243.

    13. D. J. Taplin, R. Ishikawa, T. Seki, H. Sawada, M. Weyland, N. Shibata, S. D. Findlay, "Differential Phase Contrast Imaging using a Segmented Detector",
      AMTC Letters 5 (2016) 24-25.

    14. T. Seki, E. Abe, "Direct observations of local electronic states in an Al-based quasicrystal by STEM-EELS",
      Microscopy 63 (2014) i17.

    15. T. Seki, E. Abe and S.J. Pennycook, "Quantitative Analysis of Point Defects in an Ideal Quasicrystal with Aberration- Corrected STEM and First-Principles Calculations”,
      AMTC Letters 2 (2010) 194.

    16. E. Abe, T. Seki, S. Pennycook, "Quantitative Analysis of Point Defects in an Ideal Quasicrystal by Aberration-Corrected Z-Contrast STEM",
      Microscopy and Microanalysis 15 (2009) 772-773.

    Invited Talks

    1. 関岳人, 幾原雄一, 柴田直哉, 「STEM 位相イメージングの理論と応用」
      日本顕微鏡学会第63回シンポジウム, 2020年11月20日.

    2. 関岳人, Sánchez-Santolino Gabriel, 石川 亮, Findlay Scott D., 幾原 雄一, 柴田 直哉, 「DPCによる電磁場定量法の基礎 」
      日本顕微鏡学会分析電子顕微鏡討論会, 2019年9月3日.

    3. 関岳人, 幾原雄一, 柴田直哉, 「DPC STEMによる反復ポテンシャル再生法」
      日本顕微鏡学会学術講演会, 2018年5月31日.

    4. 関岳人, G. Sánchez-Santolino, 石川亮, S.D. Findlay, 幾原雄一, 柴田直哉, 「微分位相コントラスト法による電磁場定量の現状と展望」
      日本顕微鏡学会超高分解能顕微鏡法分科会研究会, 2018年2月24日.

    Awards

    1. 2021年3月, 風戸研究奨励会 風戸研究奨励賞.

    2. 2019年5月, 日本顕微鏡学会論文賞 顕微鏡法基礎部門.

    3. 2017年5月, 日本顕微鏡学会論文賞 応用研究 非生物部門.

    4. 2013年9月, Best Poster Prize, 12th International Conference on Quasicrystals.

    5. 2011年5月, Young Scientist Award, The 6th Asian International Workshop on Quasicrystal.