Takehito Seki
Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
Phone +81-3-5841-7689
Fax +81-3-5841-7694
mail: seki sigma.t.u-tokyo.ac.jp(please insert @ instead of space)
2019 - Assistant Professor, The University of Tokyo.
2015 - 2019 Poctdoctoral Fellow, The University of Tokyo.
2014 - 2015 JSPS Research Fellowship (PD)
2013 - 2014 JSPS Research Fellowship (DC2)
2011 - 2014 Ph.D. The University of Tokyo
STEM Imaging Using a Segmented Detector
Complex metallic alloy
Peer Review Papers
- T. Seki, Y. Ikuhara, N. Shibata, "Toward quantitative electromagnetic field imaging by differential-phase-contrast scanning transmission electron microscopy",
Microscopy 70 (2020) 148-160.
- D. G. Hopkinson, T. Seki, N. Clark, R. Chen, Y. Zou, A. Kimura, R. V. Gorbachev, T. Thomson, N. Shibata, S. J. Haigh, "Nanometre imaging of Fe3GeTe2 ferromagnetic domain walls",
Nanotechnology 32 (2021) 205703.
- H. Zeng, T. Takahashi, T. Seki, M. Kanai, G. Zhang, T. Hosomi, K. Nagashima, N. Shibata, T. Yanagida, "Oxygen-Induced Reversible Sn-Dopant Deactivation between Indium Tin Oxide and Single-Crystalline Oxide Nanowire Leading to Interfacial Switching",
ACS Applied Materials & Interfaces 12 (2020) 52929-52936.
- K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "Ultra-high contrast STEM imaging for segmented/pixelated detectors by maximizing the signal-to-noise ratio",
Ultramicroscopy 220 (2021) 113133.
- Y. O. Murakami, T. Seki, A. Kinoshita, T. Shoji, Y. Ikuhara, N. Shibata, "Magnetic-structure imaging in polycrystalline materials by specimen-tilt series averaged DPC STEM",
Microscopy 69 (2020) 312-320.
- S. Toyama, T. Seki, S. Anada, H. Sasaki, K. Yamamoto, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping of a p–n junction by DPC STEM",
Ultramicroscopy 216 (2020) 113033.
- K. Nakamura, T. Takahashi, T. Hosomi, T. Seki, M. Kanai, G. Zhang, K. Nagashima, N. Shibata, T. Yanagida, "Redox-Inactive CO2 Determines Atmospheric Stability of Electrical Properties of ZnO Nanowire Devices through a Room-Temperature Surface Reaction",
ACS Applied Materials & Interfaces 11 (2019) 40260-40266.
- N. Shibata, Y. Kohno, A. Nakamura, S. Morishita, T. Seki, A. Kumamoto, H. Sawada, T. Matsumoto, S. D. Findlay, Y. Ikuhara, "Atomic resolution electron microscopy in a magnetic field free environment",
Nature Communications 10 (2019) 2308.
- K. Ooe, T. Seki, Y. Ikuhara, N. Shibata, "High contrast STEM imaging for light elements by an annular segmented detector"
Ultramicroscopy 202 (2019) 148-155.
- H. Anzai, T. Takahashi, M. Suzuki, M. Kanai, G. Zhang, T. Hosomi, T. Seki, K. Nagashima, N. Shibata, T. Yanagida, "Unusual Oxygen Partial Pressure Dependence of Electrical Transport of Single-Crystalline Metal Oxide Nanowires Grown by the Vapor–Liquid–Solid Process"
Nano Letters 19 (2019) 1675-1681.
- R. Ishikawa, S.D. Findlay, T. Seki, G. Sanchez-Santlino, Y. Kohno, Y. Ikuhara, N. Shibata, "Direct electric field imaging of graphene defects"
Nature Communications 9 (2018) 3878.
- G. Sánchez-Santolino, N.R. Lugg, T. Seki, R. Ishikawa, S.D. Findlay, Y. Kohno, Y. Kanitani, S. Tanaka, S. Tomiya, Y. Ikuhara, N. Shibata, "Probing the Internal Atomic Charge Density Distributions in Real Space"
ACS Nano 12 (2018) 8875–8881.
- T. Seki, N. Takanashi, E. Abe, "Integrated contrast-treansfer-function for aberration-corrected phase-contrast"
Ultramicroscopy 194 (2018) 193-198.
- T. Seki, Y. Ikuhara, N. Shibata,"Theoretical Framework of Statistical Noise in Scanning Transmission Electron Microscopy"
Ultramicroscopy 193 (2018) 118-125.
- C. Chen, H. Li, T. Seki, D. Yin, G. Sanchez-Santolino, K. Inoue, N. Shibata, Y. Ikuhara,"Direct Determination of Atomic Structure and Magnetic Coupling of Magnetite Twin Boundaries"
ACS Nano 12 (2018) 2662-2668.
- N. Shibata, S.D. Findlay, T. Matsumoto, Y. Kohno, T. Seki, G. Sánchez-Santolino, Y. Ikuhara, "Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy"
Accounts of Chemical Research 50 (2017) 1502.
- A.Ishizuka, M. Oka, T. Seki, N. Shibata, K. Ishizuka,"Boundary-artifact-free determination of potential distribution from differential phase contrast signals"
Microscopy 66 (2017) 397-405.
- T. Seki, G.S. Santolino, R. Ishikawa, S.D. Findlay, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping in thin specimens using a segmented detector: revisiting the transfer function for differential phase contrast"
Ultramicroscopy 182 (2017) 258.
- H. Anzai, M. Suzuki, K. Nagashima, M. Kanai, Z. Zhu, Y. He, M. Boudot, G. Zhang, T. Takahashi, K. Kanemoto, T.Seki, N. Shibata, T. Yanagida, "True Vapor–Liquid–Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires"
Nano Letters 17 (2017) 4698.
- N. Shibata, T. Seki, G.S. Santolino, S.D. Findlay, Y. Kohno, T. Matsumoto, R. Ishikawa, Y. Ikuhara, "Electric field imaging of single atoms"
Nature Communications 8 (2017) 15631.
- T. Seki, E. Abe, "Local cluster symmetry of a highly ordered quasicrystalline Al58Cu26Ir16 extracted through multivariate analysis of STEM images",
Microscopy 64 (2015) 241.
Review Articles
- 関岳人, Sánchez-Santolino Gabriel, 石川亮, 幾原雄一, 柴田直哉, "原子分解能微分位相コントラストSTEM法の理論",
顕微鏡 52 (2017) 8.
- E. Abe, D. Egusa, R. Ishikawa and T. Seki, "Ultrahigh-Resolution STEM Analysis of Complex Compounds",
JEOL News 45 (2010) 20.
Conference Proceedings
- T. Seki, Y. Ikuhara, N. Shibata, "Iterative Algorithm of Atomic Potential Reconstruction Based on DPC Signal from Thick Specimens",
Microscopy and Microanalysis 25 (2019) 60-61.
- T. Seki, G.S. Santolino, R. Ishikawa, Y. Ikuhara, N. Shibata, "Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors"
Microscopy and Microanalysis 23 (2017) 440.
- T. Seki, E. Abe, "Direct observations of local electronic states in an Al-based quasicrystal by STEM-EELS",
Microscopy 63 (2014) i17.
- T. Seki, E. Abe and S.J. Pennycook, "Quantitative Analysis of Point Defects in an Ideal Quasicrystal with Aberration- Corrected STEM and First-Principles Calculations”,
AMTC Letters 2 (2010) 194.
Invited Talks
- 関岳人, 幾原雄一, 柴田直哉, 「STEM 位相イメージングの理論と応用」
日本顕微鏡学会第63回シンポジウム, 2020年11月20日.
- 関岳人, Sánchez-Santolino Gabriel, 石川 亮, Findlay Scott D., 幾原 雄一, 柴田 直哉, 「DPCによる電磁場定量法の基礎 」
日本顕微鏡学会分析電子顕微鏡討論会, 2019年9月3日.
- 関岳人, 幾原雄一, 柴田直哉, 「DPC STEMによる反復ポテンシャル再生法」
日本顕微鏡学会学術講演会, 2018年5月31日.
- 関岳人, G. Sánchez-Santolino, 石川亮, S.D. Findlay, 幾原雄一, 柴田直哉, 「微分位相コントラスト法による電磁場定量の現状と展望」
日本顕微鏡学会超高分解能顕微鏡法分科会研究会, 2018年2月24日.
Awards
- May 2019, Award for Scientific Paper (Fundamentals), The Japanese Society of Microscopy.
- May 2017, Award for Scientific Paper (Materials), The Japanese Society of Microscopy.
- Sep. 2013, Best Poster Prize, 12th International Conference on Quasicrystals.
- AMay 2011, Young Scientist Award, The 6th Asian International Workshop on Quasicrystal.