Satoko Toyama




Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
Phone +81-3-5841-7689
Fax +81-3-5841-7694
mail: toyama     sigma.t.u-tokyo.ac.jp(please insert @ instead of space)



Contents

  • Profile
  • Research
  • Publication list








    • Profile



  • 2014 - 2018 B.E. The University of Tokyo
  • 2018 - 2023 Materials Education program for the future leaders in Research, and Technology (MERIT)
  • 2018 - 2020 M.S. The University of Tokyo
  • 2020 - 2023 Ph.D. The University of Tokyo
  • 2020 - 2023 Research fellow, JSPS research fellowship for young scientists (DC1)
  • 2023- Project Assistant Professor




    • Research Topics


    Development of electromagnetic field imaging at a high spatial resolution by DPC STEM

    My research centers on the development and applications of electromagnetic field imaging at a high spatial resolution using scanning transmission electron microscopy (STEM). By introducing specific detectors on the bright field in STEM, the electromagnetic field inside a specimen can be visualized. This technique is called differential phase contrast STEM (DPC STEM). My works include developing the quantitativeness of DPC STEM and applying this technique to GaN-based semiconductor devices, oxides grain boundaries, and magnetic memory devices.

    Publication list


    Papers

    1. S. Toyama, T. Seki, Y. Kanitani, Y. Kudo, S. Tomiya, Y. Ikuhara, N. Shibata,
      “Real-space observation of a two-dimensional electron gas at semiconductor heterointerfaces",
      Nature Nanotechnology (2023)

    2. T. Seki, K. Khare, Y. O. Murakami, S. Toyama, G. Sanchez-Santolino, H. Sasaki, S. D. Findlay, T. C. Petersen, Y. Ikuhara, N. Shibata,
      “Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM",
      Ultramicroscopy 240 113580 (2022)

    3. S. Toyama, T. Seki, Y. Kanitani, Y. Kudo, S. Tomiya, Y. Ikuhara, N. Shibata,
      “Quantitative electric field mapping in semiconductor heterostructures via tilt-scan averaged DPC STEM",
      Ultramicroscopy 238 113538 (2022)

    4. 遠山慧子, 関岳人, 蟹谷裕也, 冨谷茂隆, 幾原雄一, 柴田直哉,
      「微分位相コントラストSTEMを用いたGaN/AlGaN/InGaNマルチヘテロ接合の局所電場観察」,
      電気学会論文誌C 142 367-372 (2022)

    5. S. Toyama, T. Seki, S. Anada, H. Sasaki, K. Yamamoto, Y. Ikuhara, N. Shibata,
      “Quantitative electric field mapping of a p–n junction by DPC STEM",
      Ultramicroscopy 216 113033 (2020)

    6. S. Toyama, T. Seki, H. Sasaki, Y. Ikuhara, N. Shibata,
      “Electric field quantification method for a p-n junction by DPC STEM”,
      AMTC Letters, 6 20 (2019)

    7. 遠山慧子, 関岳人, 佐々木宏和, 幾原雄一, 柴田直哉，
      「DPC STEMを用いた高分解能pn接合電場観察手法」,
      まてりあ, 57 102(2019)

    Conferences

    1. 遠山 慧子(招待講演)，「Direct observation of electric field in crystal interfaces by differential phase contrast STEM」，日本顕微鏡学会若手研究部会2022年度シンポジウム，2022年9月, oral

    2. S. Toyama, T. Seki, B. Feng, Y. Ikuhara, N. Shibata, “High resolution electric field mapping at crystal interfaces by tilt-scan averaged DPC STEM”, MRS Fall meeting, November 2022, oral

    3. 遠山慧子, 西川文子, 村上善樹, 関岳人, 熊本明仁, 幾原雄一, 柴田直哉, 「時間反転DPC 法によるCo 微粒子の磁場分布直接観察」，日本顕微鏡学会，2022年5月, oral

    4. 遠山慧子, 関岳人, 馮斌, 幾原雄一, 柴田直哉, 「微分位相コントラストSTEM を用いたYSZ 粒界スペースチャージ層の直接観察」，日本金属学会，2021年9月, oral

    5. 遠山慧子, 関岳人, 馮斌, 幾原雄一, 柴田直哉, 「DPC STEMを用いた酸化物粒界空間電荷層の直接観察」，日本顕微鏡学会，2021年6月, oral

    6. S. Toyama, T. Seki, Y. Kanitani, Y. Kudo, S. Tomiya, Y. Ikuhara, N. Shibata, “Quantitative electric field imaging in GaN-based heterostructures by DPC STEM”, The 17th European Microscopy Congress, September 2020

    7. 遠山慧子, 関岳人, 蟹谷裕也, 工藤喜弘, 冨谷茂隆, 幾原雄一, 柴田直哉, 「DPC STEMを用いたGaN系半導体ヘテロ界面の電場直接観察」，日本顕微鏡学会，2020年6月, oral

    8. S. Toyama, T. Seki, H. Sasaki, Y. Ikuhara, N. Shibata, “Quantitative electric field imaging of a p-n junction by DPC STEM”, Frontiers of Electron Microscopy and Materials Science, Asheville, September 2019, poster

    9. 遠山慧子, 関岳人, 蟹谷裕也, 工藤喜弘, 冨谷茂隆, 幾原雄一, 柴田直哉, 「DPC STEM を用いたGaN系半導体ヘテロ界面電場直接観察」，第80回応用物理学会秋季学術講演会，札幌，2019年9月, oral

    10. 遠山慧子, 「GaN系半導体内部の分極電場とキャリア」, 結晶界面研究会, 葉山, 2019年9月

    11. 遠山慧子, 関岳人, 蟹谷裕也, 工藤喜弘, 冨谷茂隆, 幾原雄一, 柴田直哉, 「DPC STEMを用いたGaN/AlGaN界面電場直接観察」，日本顕微鏡学会，名古屋，2019年6月, oral

    12. S. Toyama, T. Seki, H. Sasaki, Y. Ikuhara, N. Shibata, “Electric field quantification method for a p-n junction by DPC STEM”, The 6th International Symposium on Advanced Microscopy and Theoretical Calculations, Nagoya, June 2019, poster

    13. S. Toyama, T. Seki, H. Sasaki, Y. Ikuhara, N. Shibata, “Electric field quantification method for a p-n junction by DPC STEM”, 19th International Microscopy Congress, Sydney, September 2018, poster

    14. 遠山慧子, 「酸化物ヘテロ界面における二次元電子ガス発生機構」, 結晶界面研究会, 葉山, 2018年9月

    15. 遠山慧子, 関岳人, 佐々木宏和, 幾原雄一, 柴田直哉, 「DPC STEMを用いた高分解能電場定量化手法の開発」, 日本顕微鏡学会, 久留米, 2018年5月, oral

    Awards


    　
    1. Dean's Award The University of Tokyo (Best Research Award), 2023

    2. The Best poster award, The 64th Symposium of The Japanese Society of Microscopy 2021

    3. Young Student Award, The Japan Institute of Metals and Materials & The Iron and Steel Institute of Japan, 2018

    4. Dean's Award The University of Tokyo, 2018