Takehito Seki

Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
Phone +81-3-5841-7689
Fax +81-3-5841-7694
mail: seki     sigma.t.u-tokyo.ac.jp(please insert @ instead of space)


  • 2015 - Poctdoctoral Fellow, The University of Tokyo.
  • 2014 - 2015 JSPS Research Fellowship (PD)
  • 2013 - 2014 JSPS Research Fellowship (DC2)
  • 2011 - 2014 Ph.D. The University of Tokyo

  • Research

    STEM Imaging Using a Segmented Detector

    Complex metallic alloy

    Publication list

    Peer Review Papers

    1. A.Ishizuka, M. Oka, T. Seki, N. Shibata, K. Ishizuka,"Boundary-artifact-free determination of potential distribution from differential phase contrast signals"
      Microscopy 66 (2017) 397-405.

    2. T. Seki, G.S. Santolino, R. Ishikawa, S.D. Findlay, Y. Ikuhara, N. Shibata, "Quantitative electric field mapping in thin specimens using a segmented detector: revisiting the transfer function for differential phase contrast"
      Ultramicroscopy 182 (2017) 258.

    3. H. Anzai, M. Suzuki, K. Nagashima, M. Kanai, Z. Zhu, Y. He, M. Boudot, G. Zhang, T. Takahashi, K. Kanemoto, T.Seki, N. Shibata, T. Yanagida, "True Vapor–Liquid–Solid Process Suppresses Unintentional Carrier Doping of Single Crystalline Metal Oxide Nanowires"
      Nano Letters 17 (2017) 4698.

    4. N. Shibata, T. Seki, G.S. Santolino, S.D. Findlay, Y. Kohno, T. Matsumoto, R. Ishikawa, Y. Ikuhara, "Electric field imaging of single atoms"
      Nature Communications 8 (2017) 15631.

    5. T. Seki, E. Abe, "Local cluster symmetry of a highly ordered quasicrystalline Al58Cu26Ir16 extracted through multivariate analysis of STEM images",
      Microscopy 64 (2015) 241.

    Review Articles

    1. N. Shibata, S.D. Findlay, T. Matsumoto, Y. Kohno, T. Seki, G. Sánchez-Santolino, Y. Ikuhara, "Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy"
      Accounts of Chemical Research 50 (2017) 1502.A

    2. 関岳人, Sánchez-Santolino Gabriel, 石川亮, 幾原雄一, 柴田直哉, "原子分解能微分位相コントラストSTEM法の理論",
      顕微鏡 52 (2017).

    3. E. Abe, D. Egusa, R. Ishikawa and T. Seki, "Ultrahigh-Resolution STEM Analysis of Complex Compounds",
      JEOL News 45 (2010) 20.

    Conference Proceedings

    1. T. Seki, G.S. Santolino, R. Ishikawa, Y. Ikuhara, N. Shibata, "Quantitative Relation Between Differential Phase Contrast Images Obtained by Segmented and Pixelated Detectors"
      Microscopy and Microanalysis 23 (2017) 440.

    2. T. Seki, E. Abe, "Direct observations of local electronic states in an Al-based quasicrystal by STEM-EELS",
      Microscopy 63 (2014) i17.

    3. T. Seki, E. Abe and S.J. Pennycook, "Quantitative Analysis of Point Defects in an Ideal Quasicrystal with Aberration- Corrected STEM and First-Principles Calculations”,
      AMTC Letters 2 (2010) 194.


    1. May 2017, Award for Scientific Paper (Materials), The Japanese Society of Microscopy.

    2. Sep. 2013, Best Poster Prize, 12th International Conference on Quasicrystals.

    3. AMay 2011, Young Scientist Award, The 6th Asian International Workshop on Quasicrystal.