松元 隆夫
Yayoi 2-11-16, Bunkyo-ku, Tokyo, Japan, 113-8656
Phone +81-3-5841-1183
Fax +81-3-5841-0849
mail: takaomatsumoto★g.ecc.u-tokyo.ac.jp(please insert @ instead of ★)
2012 - Senior Research Scientist, The University of Tokyo.
1988 - 2011 Senior Research Scientist,
Hitachi Advanced/Central Research Laboratory.
1997 Ph.D. The University of Tokyo.
Physics and engineering of magnetic skyrmion
Applications of Magnetic field-free Atomic Resolution STEM (MARS)
Topological defects in ferroelectric/magnetic/multiferroic materials
Fundamental aspects of quantum mechanics unveiled by electron microscopy
Papers
- “Direct visualization of nucleation intermediate state of magnetic skyrmion from helical stripes assisted by artificial surface pits”
Takao, Matsumoto, Yeong-Gi, So, Yuichi, Ikuhara, and Naoya, Shibata
J. Mag. Magn. Mat. 531 (2021) 167976.
- “Advanced Scanning Transmission Electron Microscopy as a Tool for Direct Real-Space Visualization and Artificial Control of Quantum Spin Textures”
Takao, Matsumoto, Yuichi, Ikuhara, and Naoya, Shibata
Microsc. Microanal. 25 (2019) 954-955.
- “Stable Magnetic Skyrmion States at Room Temperature Confined to Corrals of Artificial Surface Pits Fabricated by a Focused Electron Beam”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Yuichi, Ikuhara, and Naoya, Shibata
Nano Letters 18 (2018) 754-762.
- “Direct observation of ∑7 domain boundary core structure in magnetic Skyrmion lattice”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Hidetaka, Sawada, Yuichi, Ikuhara, and Naoya, Shibata
Science Advances 2 (2016) e1501280.
- “Jointed magnetic skyrmion lattices at a small-angle grain boundary directly visualized by advanced electron microscopy”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Hidetaka, Sawada, Ryo, Ishikawa, Yuichi, Ikuhara, and Naoya, Shibata
Scientific Reports 6 (2016) 35880.
- “Direct visualization of the correlated atomic shift and tilting of MnO5 polyhedron in multiferroic hexagonal YMnO3 single crystal using a spherical aberration-corrected STEM”
Takao Matsumoto, Ryo Ishikawa, Tetsuya Tohei, Naoya Shibata, Yuichi Ikuhara, Hideo Kimura, Qiwen Yao, Hongyang Zhao, Xiaolin Wang, Dapeng Chen, Zhenxiang Cheng
Nano Letters 13 (2013) 4594-4601.
- “Effects of electron irradiation on the ferroelectric 180° in-plane nanostripe domain structure in a thin film prepared from bulk single crystal of BaTiO3 by FIB”
T. Matsumoto and M. Okamoto
Journal of Applied Physics, 109 (2011) 014104.
- “Effects of electron irradiation on the ferroelectric 180° in-plane nanostripe domain structure in a thin film prepared from bulk single crystal of BaTiO3 by FIB”
T. Matsumoto and M. Okamoto
Journal of Applied Physics, 109 (2011) 014104.
- “Ferroelectric 180°a-a Nanostripe and Nanoneedle Domains in Thin Films of BaTiO3 prepared with FIB”
T. Matsumoto and M. Okamoto
Special Issue of IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control (Invited), 57 (2010) pp. 2127-2133.
- 「セラミックス材料評価における透過型電子顕微鏡法の活用」
松元 隆夫、本吉 康弘
日本顕微鏡学会和文誌「顕微鏡」 第44巻1号pp.7-10 (2009)
- “Ferroelectric 90° domain structure in a thin film of BaTiO3 fine ceramics observed by 300 kV electron holography”
T. Matsumoto, M. Koguchi, K. Suzuki, H. Nishimura, Y. Motoyoshi, and N. Wada
Applied Physics Letters 92 (2008) 072902.
- “The phase constancy of electron waves traveling through Boersch’s electrostatic phase plate”
T. Matsumoto and A. Tonomura (1996)
Ultramicroscopy 63 (1996) pp.5–10.
- “Visualization of DNA in Solution by Fraunhofer In-Line Electron Holography: II. Experiments”
T. Matsumoto, T. Tanji, and A. Tonomura
Optik 100 (1995) pp.71-74.
- “Visualization of DNA in Solution by Fraunhofer In-Line Electron Holography: I. Simulation”
T. Matsumoto
Optik 99 (1995) pp.25-28.
- “Application of Maximum Entropy Method (MEM) in In-Line Fresnel Electron Holography”
T. Matsumoto, T. Tanji, and A. Tonomura
Optik 97 (1994) pp.169-173.
- “Phase-Contrast Visualization of an Undecagold Cluster by In-Line Felectron Holography”
T. Matsumoto, T. Tanji, and A. Tonomura
Ultramicroscopy 54 (1994) pp.317-334.
Conference proceedings
- “Advanced Scanning Transmission Electron Microscopy as a Tool for Direct Real- Space Visualization and Artificial Control of Quantum Spin Textures”
T. Matsumoto, Y. Ikuhara, and N. Shibata
Microsc. Microanal. 25 (Suppl 2) (2019) 954-955.
- “Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Hidetaka, Sawada, Yuichi, Ikuhara, and Naoya, Shibata
EMC2016 Proceedings of the 16th European Microscopy Congress, Lyon, France, Aug. 28-Sep.2, 2016
- “TEM OBSERVATIONS AND PHASE-FIELD SIMULATIONS OF UNCONVENTIONAL FERROELECTRIC 180° NANOSTRIPE DOMAINS IN THIN FILMS PREPARED FROM A BULK SINGLE CRYSTAL OF BaTiO3 WITH FIB”
T. Matsumoto and M. Okamoto
Proceedings of the 2009 18th IEEE International Symposium on Applications of Ferroelectrics, Xi’an, China, Aug. 23-27, 2009; Ren, W.; Eds. pp. 51-54.
- “High-resolution pictures of nucleation growth triangle of 180° ferroelectric domain wall in a thin film of LiTaO3 obtained by Lorentz DPC-STEM”
T. Matsumoto, Y. Takahashi, and M. Koguchi
EMC2008 Proceedings of the 14th European Microscopy Congress, Aachen, Germany, Sep. 1-5, 2008; Richter, S.; Schwedt, A.; Eds.; Springer-Verlag: Berlin Heidelberg, 2008, Vol. 2, pp. 549-550.
- “Electrostatic Structure of Ferroelectric Domain in a Thin Film of BaTiO3 Fine Ceramics Observed by 300-kV Electron Holography and Coulomb-deflection STEM”
T. Matsumoto, M. Koguchi, K. Suzuki, H. Nishimura, Y. Motoyoshi, and N. Wada
FEMMS2007, Sonoma City, CA, U.S.A
- “A Microfabricated Boersch Phase Plate for Electron Microscopy”
T. Matsumoto
Proc. of the 32nd International Conference on Micro- and Nano-Engineering (MNE), Sep. 17-25 (2006), Barcelona, Spain
- “Electron holography as a tool for dopant profile characterization of semiconductor devices”
T. Matsumoto and M. Koguchi
Proc. of 2004 MRS Fall Meeting, Boston, U.S.A.
- “Fraunhofer In-Line Electron Holography of Frozen-Hydrated DNA Superhelices”
T. Matsumoto, T. Tanji, and A. Tonomura
International Workshop on Electron Holography, August 29-31 (1994) Knoxville, U.S.A. Eds. A.Tonomura, L.F.Allard, G.Pozzi, D.C. Joy and Y.A. Ono, Electron Holograpy, North-Holland, Amsterdam 1995, pp.249-256.
- “A High-resolution Fraunhofer In-Line Electron Holography”
T. Matsumoto, T. Tanji, and A. Tonomura
Proc. of the 52nd Annual Meeting of the Microscopy Society of America pp.128-129 (1994) New Orleans, U.S.A.
- “A High-resolution Fraunhofer In-Line Electron Holography”
T. Matsumoto, T. Tanji, and A. Tonomura
Proc. of the 51st Annual Meeting of the Microscopy Society of America pp.1222-1223 (1993) Cincinnati, U.S.A.
- “Electron Holography of Frozen-hydrated Biological Specimen”
T. Matsumoto, N. Osakabe, J. Endo, T. Matsuda, and A. Tonomura
Proc. of the 49th Annual Meeting of Electron Microscopy Society of America, ed. By G.W. Bailey (San Francisco Press, San Francisco, CA, U.S.A. pp.686-687 (1991) San Jose, U.S.A.
Lectures (International)
- “Advanced Scanning Transmission Electron Microscopy as a Tool for Direct Real- Space Visualization and Artificial Control of Quantum Spin Textures” (Invited)
Takao, Matsumoto, Yuichi, Ikuhara, and Naoya, Shibata
M&M (Microscopy and Microanalysis) 2019, Portland, Oregon, Aug. 4-8, 2019
- “Stable skyrmion states at room temperature confined in corrals of artificial surface pits fabricated by a focused electron beam”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Takehito, Seki, Akiho Nakamura, Shigeyuki Morishita, Yuichi, Ikuhara, and Naoya, Shibata
Intermag2018, Singapore, Singapore, Apr. 23-Apr.25, 2018
- “Direct observation of the interaction of room-temperature magnetic skyrmion with surface defects by differential phase contrast (DPC) STEM”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Takehito, Seki, Akiho Nakamura, Shigeyuki Morishita, Yuichi, Ikuhara, and Naoya, Shibata
SkyMag2017, Paris, France, May. 2-May.5, 2017
- “Direct Visualization of Magnetic Skyrmion by Aberration-Corrected Differential Phase Contrast Scanning Transmission Electron Microscopy”
Takao, Matsumoto, Yeong-Gi, So, Yuji, Kohno, Hidetaka, Sawada, Yuichi, Ikuhara, and Naoya, Shibata
EMC2016 Proceedings of the 14th European Microscopy Congress, Lyon, France, Aug. 28-Sep.2, 2016
- “Zoom into the multiferroic vortex core in a hexagonal YMnO3 single crystal by an aberration-corrected TEM: a direct visualization of the topological vortex core pinned by another topological defect on the atomic scale”
Takao Matsumoto, Ryo Ishikawa, Tetsuya Tohei, Hideo Kimura, Qiwen Yao, Hongyang Zhao, Xiaolin Wang, Dapeng Chen, Zhenxiang Cheng, Naoya Shibata, and Yuichi Ikuhara
FEMMS 2013, 2013.9.8-13. Mantra Lorne, Australia
- “Direct Visualization of the Correlated Atomic Shift and Tilting of MnO5 Polyhedron in Multiferroic Hexagonal YMnO3 Single Crystal using Aberration-Corrected STEM”
Takao Matsumoto, Ryo Ishikawa, Tetsuya Tohei, Naoya Shibata, Yuichi Ikuhara, Hideo Kimura, Qiwen Yao, Hongyang Zhao, Xiaolin Wang, Dapeng Chen, Zhenxiang Cheng
SCANDEM 2013, 2013.6.10-14. Copenhagen, Denmark
- “Low-voltage Electron Holographic Characterization of Natural Graphene Origami”
T. Matsumoto, Gordon Research Conference on Microfabrication, Jul. (2010), Tilton, NH, U.S.A.
- “TEM observations and phase-field simulations of unconventional ferroelectric 180° nanostripe domains in thin films prepared from a bulk single crystal of BaTiO3 with FIB”
2T. Matsumoto and M. Okamoto
IMF-ISAF-2009, Aug. (2009) Xiian, China
- “High-resolution pictures of nucleation growth triangle of 180° ferroelectric domain wall in a thin film of LiTaO3 obtained by Lorentz DPC-STEM”
T. Matsumoto, Y. Takahashi, and M. Koguchi
EMC2008, Sep. (2008) Aachen, Germany
- “Electrostatic Structure of Ferroelectric Domain in a Thin Film of BaTiO3 Fine Ceramics Observed by 300-kV Electron Holography and Coulomb-deflection STEM”
T. Matsumoto, M. Koguchi, K. Suzuki, H. Nishimura, Y. Motoyoshi, and N. Wada
FEMMS2007, Sep. (2007) Sonoma City, CA, U.S.A
- “A Microfabricated Boersch Phase Plate for Electron Microscopy”
T. Matsumoto
The 32nd International Conference on Micro- and Nano-Engineering (MNE), Sep. (2006), Barcelona, Spain
- “ELECTRON HOLOGRAPHY AS A TOOL FOR DOPANT PROFILE CHARACTERIZATION OF SEMICONDUCTOR DEVICES”
T. Matsumoto and M. Koguchi
2004 MRS Fall Meeting, Dec. (2004) Boston, U.S.A.
- “Fraunhofer In-Line Electron Holography of Frozen-Hydrated DNA Superhelices”
T. Matsumoto, T. Tanji, and A. Tonomura
International Workshop on Electron Holography, Aug. (1994) Knoxville, U.S.A.
- “A High-resolution Fraunhofer In-Line Electron Holography”
T. Matsumoto, T. Tanji, and A. Tonomura
The 52nd Annual Meeting of the Microscopy Society of America, Aug. (1994) New Orleans, U.S.A.
- “A High-resolution Fraunhofer In-Line Electron Holography”
T. Matsumoto, T. Tanji, and A. Tonomura
The 51st Annual Meeting of the Microscopy Society of America, Aug. (1993) Cincinnati, U.S.A.
- “Electron Holography of Frozen-hydrated Biological Specimen”
T. Matsumoto, N. Osakabe, J. Endo, T. Matsuda, and A. Tonomura
The 49th Annual Meeting of Electron Microscopy Society of America, Aug. (1991) San Jose, U.S.A.
Lectures (Domestic)
- 「DPC STEM 法による磁気スキルミオンと人工表面ピットとの相互作用の直接観察」、日本顕微鏡学会第74回講演会、久留米シティプラザ、福岡、2018.05.30
- 「微分位相コントラスト(DPC)STEM 法による室温磁気スキルミオンと表面欠陥との相互作用の直接観察」、日本顕微鏡学会第73回講演会、札幌コンベンションセンター、北海道、2017.05.30
- 「微分位相コントラスト(DPC)STEM法による磁気スキルミオン格子分域の直接観察」、日本顕微鏡学会第72回講演会、仙台国際センター、宮城、2016.06.14-16
- 「DPC STEM法による磁性材料観察」、材料の微細組織と機能性第133委員会第228回研究会、JR博多シティ、福岡、2015.09.19
- 「微分位相コントラスト(DPC)STEM法による磁気スキルミオンの直接観察」、日本顕微鏡学会第71回講演会、京都国際会議場、京都、2015.05.14
- 「人工的に転位を導入した六方晶YMnO3薄膜中のstring状分極ドメインの直接観察」、日本顕微鏡学会第70回講演会、幕張メッセ、千葉、2014.05.13
- 「球面収差補正STEMを用いたマルチフェロイック分極ドメイン界面の原子構造直接観察」、日本顕微鏡学会第69回講演会、ホテル阪急、大阪、2013.05.22
- 「TEMによるセラミックス(強誘電体)材料の解析」、日本顕微鏡学会関東支部第34回講演会、帝京大学、東京、2010.03.20
- 「チタン酸バリウム単結晶薄膜内部のドメイン構造のTEM観察とTDGLシミュレーション」、日本顕微鏡学会第65回学術講演会、東北大学、仙台、2009.05.25
- 「電子顕微鏡による強誘電体ドメインの観察」、誘電体研究委員会第101回定例会、東京理科大学、東京、2008.07.18
- 「ローレンツDPC-STEM法による強誘電体分極反転構造の観察」、日本顕微鏡学会第64回学術講演会、京都国際会館、京都、2008.05.21
- 「電子線ホログラフィーによるドーパントプロファイルの可視化」、第63回日本顕微鏡学会学術講演会、朱鷺メッセ、新潟、2007.05.22
- 「電子線ホログラフィーによるドーパント分布解析」、第21回分析電子顕微鏡討論会、幕張メッセ、東京、2005.08.30
- 「電子線ホログラフィーによる半導体ドーパントプロファイルの評価」、学振ナノプローブテクノロジー第167委員会第39回研究会、東京工業大学、東京、2005.07.28
- 「電子顕微鏡による半導体ドーパント分布評価手法」、NanoTech展、幕張メッセ、東京、2005.02.23
Patents
出願番号 | 出願国 | 発明の名称 |
特07-340270 | 日本 | 位相差電子顕微鏡およびその位相板 |
特08/768355 | 米国 | 位相差電子顕微鏡およびその位相板 |
特05814815 | 米国 | 位相差電子顕微鏡およびその位相板 |
特10-366338 | 日本 | 微細加工方法、磁気力顕微鏡用プローブおよび電場センサ |
特09/464441 | 米国 | 微細加工方法、磁気力顕微鏡用プローブおよび電場センサ |
特06387851 | 米国 | 微細加工方法、磁気力顕微鏡用プローブおよび電場センサ |
特2001-310858 | 日本 | 収束荷電粒子線加工方法および収束荷電粒子線加工装置 |
特2003-381951 | 日本 | 二次元配列構造体基板および該基板から剥離した微粒子 |
特2004-108643 | 日本 | 走査電子線干渉計測方法、および透過電子顕微鏡 |
特2004-357539 | 日本 | 走査干渉電子顕微鏡 |
特07417227 | 米国 | 走査干渉電子顕微鏡 |
特2005-148899 | 日本 | 透過型干渉電子顕微鏡 |
特2005-294276 | 日本 | 磁性電子顕微鏡 |
特07518111 | 米国 | 磁性電子顕微鏡 |
特2007-050921 | 日本 | 透過型電子顕微鏡 |
特2007-006162 | 日本 | 電子顕微鏡 |
特2007-305380 | 日本 | 走査透過型電子顕微鏡 |