The University of Tokyo School of Engineering Institute of Engineering Innovation
The latest Paper
- Y.O. Murakami, T. Seki, K. Tabata, Y. Ikuhara, N. Shibata, "Quantitative evaluation of local magnetic property using magnetic domain wall width measurement with tilt-scan averaged DPC STEM"
Ultramicroscopy, 272, 114132 (2025).
- F.S. Ong, K. Kawamura, K. Hosoi, H. Masuda, B. Feng, K. Matsui, Y. Ikuhara, H. Yoshida, "Low-furnace-temperature flash sintering of tetragonal 1.5-mol% YSZ: Role of particle necking on grain growth"
Journal of the American Ceramic Society, e20490 (2025).
- H. Idzuchi, A.E.L. Allcca, A.K.A. Lu, M. Saito, S. Das, J.F. Ribeiro, M. Houssa, R. Meng, K. Inoue, X. Pan, K. Tanigaki, Y. Ikuhara, T. Nakanishi, Y.P. Chen, "Enhanced ferromagnetism in an artificially stretched lattice in quasi-two-dimensional Cr2Ge2Te6"
Physical Review B, 111, L020402 (2025).
- A. Jeong, M. Yoshimura, H. Kong, Z. Bian, J. Tam, B. Feng, Y. Ikuhara, T. Endo, Y. Matsuo, H. Ohta, "High-performance solid-state electrochemical thermal switches with earth-abundant cerium oxide"
Science Advances, 11, ads6137 (2025).
- S. Kondo, N. Shibata, Y. Ikuhara, "Direct observations of jog formation and drag caused by screw-screw dislocation interaction"
Scripta Materialia, 258, 116513 (2025).
- M. Sou, S. Kondo, T. Sato, E. Tochigi, N. Shibata, Y. Ikuhara, "Atomic-scale observations of dislocation junction formation and decomposition processes in gold"
Scripta Materialia, 258, 116505 (2025).
- K. Ooe, T. Seki, M. Nogami, Y. Ikuhara, N. Shibata, "Dose-efficient phase-contrast imaging of thick weak phase objects via OBF STEM using a pixelated detector"
Microscopy, 74, 98-106 (2025).
- F.S. Ong, K. Nambu, K. Kawamura, K. Hosoi, H. Masuda, B. Feng, K. Matsui, Y. Ikuhara, H. Yoshida, "Realizing near-full density monophasic tetragonal 1.5-mol% yttria-stabilized zirconia ceramics via current-ramp flash sintering"
Acta Materialis, 283, 120496 (2025).
- J. Wei, Z. Xu, W. SHen, B. Feng, R. Ishikawa, N. Shibata, Y. Ikuhara, "Real-Space Tilting Method for Atomic Resolution STEM Imaging of Nanocrystalline Materials"
Small Methods, 9, 2401023 (2025).
- K. Kawahara, R. Ishikawa, S. Sasano, N. Shibata, Y. Ikuhara, "Total third-degree variation for noise reduction in atomic-resolution STEM images"
Microscopy, 74, 1-9 (2025).