Menu
[1] T. Aizawa, T. Akhadejdamrong, C. Iwamoto, Y. Ikuhara, and A. Mitsuo, “Self-lubrication of chlorine-implanted titanium nitride coating,”Journal of the American Ceramic Society, 85[1], 21-24(2002).
[2] T. Akhadejdamrong, A. Mitsuo, C. Iwamoto, T. Yamamoto, Y. Ikuhara, and T. Aizawa, “Formation of protection layer during oxidation of Al-implanted TiN coating,” Materials Transactions, 43[6], 1291-1297(2002).
[3] T. Araki, I. Hirabayashi, J. Shibata, and Y. Ikuhara, “High critical current density scheme of YBa2Cu3O7-x films by metalorganic deposition using trifluoroacetates,” Superconductor Science & Technology, 15[6], 913-916(2002).
[4] T. Araki, T. Niwa, Y. Yamada, I. Hirabayashi, J. Shibata, Y. Ikuhara, K. Kato, T. Kato, and T. Hirayama, “Growth model and the effect of CuO nanocrystallites on the properties of chemically derived epitaxial thin films of YBa2Cu3O7-x,” Journal of Applied Physics, 92[6], 3318-3325(2002).
[5] Z. L. Hong, H. Yoshida, Y. Ikuhara, T. Sakuma, T. Nishimura, and M. Mitomo, “The effect of additives on sintering behavior and strength retention in silicon nitride with RE-disilicate,” Journal of the European Ceramic Society, 22[4], 527-534(2002).
[6] T. Honjo, H. Fuji, Y. Nakamura, T. Izumi, Y. Shiohara, J. Shibata, T. Yamamoto, Y. Ikuhara, R. Teranishi, and M. Yoshimura, “Growth mechanism of Y123 film by MOD-TFA method,” Journal of the Japan Institute of Metals, 66[3], 151-154(2002).
[7] Y. Ikuhara, “Towards new transmission electron microscopy in advanced ceramics,” Journal of the Ceramic Society of Japan, 110[3], 139-145(2002).
[8] Y. H. Ikuhara, X. L. Ma, Y. Iwamoto, Y. Ikuhara, K. Kikuta, and S. Hirano, “Interfaces between solution-derived LiMn2O4 thin films and MgO and Au/MgO substrates,” Journal of Materials Research, 17[2], 358-366(2002).
[9] Y. Ikuhara, and I. Tanaka, “Special issue on grain boundaries, interfaces, defects and localized quantum structures in ceramics - Preface,”Materials Transactions, 43[7], 1425-1425(2002).
[10] C. Iwamoto, X. Q. Shen, H. Okumura, H. Matsuhata, and Y. Ikuhara, “Structure analysis of GaN thin film with inversion domains by high voltage atomic resolution microscopy,” Materials Transactions, 43[7], 1542-1546(2002).
[11] A. Kimura, Y. Azuma, T. Suzuki, T. Saito, and Y. Ikuhara, “Microstructure of diamond-like carbon films prepared by cathodic arc deposition,”Diamond and Related Materials, 11[7], 1436-1440(2002).
[12] A. Kuwabara, J. Katamura, Y. Ikuhara, and T. Sakuma, “Influence of interaction between neighboring oxygen ions on phase stability in cubic zirconia,” Journal of the American Ceramic Society, 85[10], 2557-2561(2002).
[13] A. Kuwabara, S. Yokota, Y. Ikuhara, and T. Sakuma, “Local bonding states of titanium and germanium-doped tetragonal zirconia polycrystal and their correlation to high temperature ductility,” Materials Transactions, 43[10], 2468-2472(2002).
[14] K. Matsunaga, Y. Iwamoto, and Y. Ikuhara, “Atomic structure and diffusion in amorphous si-b-c-n by molecular dynamics simulation,”Materials Transactions, 43[7], 1506-1511(2002).
[15] K. Nakagawa, G. Pezzotti, K. Ota, Y. Ikuhara, H. Yoshida, and T. Sakuma, “Internal friction behavior of alumina polycrystals with engineered grain boundaries,” Materials Transactions, 43[7], 1557-1560(2002).
[16] A. Nakamura, T. Yamamoto, and Y. Ikuhara, “Direct observation of basal dislocation in sapphire by HRTEM,” Acta Materialia, 50[1], 101-108(2002).
[17] H. Nishimura, Y. Ikuhara, K. Ota, and G. Pezzotti, “Internal friction analysis of CaO-doped silicon carbides,” Materials Transactions, 43[7], 1552-1556(2002).
[18] F. Oba, T. Yamamoto, Y. Ikuhara, I. Tanaka, and H. Adachi, “First-principles calculations of Co impurities and native defects in ZnO,”Materials Transactions, 43[7], 1439-1443(2002).
[19] K. Sasaki, M. Nakano, Y. Ikuhara, and T. Sakuma, “Pre-holed tensile specimens for superplastic Y-TZP ceramics,” Journal of Materials Science, 37[15], 3307-3313(2002).
[20] Y. Sato, F. Oba, T. Yamamoto, Y. Ikuhara, and T. Sakuma, “Current-voltage characteristics across 0001 twist boundaries in zinc oxide bicrystals,” Journal of the American Ceramic Society, 85[8], 2142-2144(2002).
[21] J. Shibata, T. Honjo, H. Fuji, T. Araki, I. Hirabayashi, T. Hirayama, T. Izumi, Y. Shiohara, T. Yamamoto, and Y. Ikuhara, “Crystallization mechanism of Nd1+x,Ba2-xCU3O7-y and YB2CU3O7-y films deposited by metalorganic deposition method using trifluoroacetates,” Journal of Materials Research, 17[6], 1266-1275(2002).
[22] J. Shibata, T. Honjo, H. Fuji, R. Teranishi, T. Izumi, Y. Shiohara, T. Yamamoto, and Y. Ikuhara, “Transmission electron microscopic studies on the growth mechanism of YBa2Cu3O7-y and Nd1+xBa2-xCu3O7-y films formed by metalorganic deposition method using trifluoroacetates,” Physica C-Superconductivity and Its Applications, 378, 1039-1044(2002).
[23] J. Shibata, H. Yamamoto, S. A. Kulinich, T. Yamamoto, K. Terashima, T. Yoshida, and Y. Ikuhara, “Transmission electron microscopic studies of LiNb0.5Ta0.5O3 films deposited on sapphire substrates by thermal plasma spray CVD (microstructure of LiNb0.5Ta0.5O3 films deposited by thermal plasma spray CVD),” Materials Transactions, 43[7], 1517-1524(2002).
[24] N. Shibata, N. Morishige, T. Yamamoto, Y. Ikuhara, and T. Sakuma, “Stacking-fault formation in 001 small-angle symmetric tilt grain boundaries in cubic zirconia bicrystals,” Philosophical Magazine Letters, 82[4], 175-181(2002).
[25] N. Shibata, F. Oba, T. Yamamoto, Y. Ikuhara, and T. Sakuma, “Atomic structure and solute segregation of a Sigma=3, 110 /{111} grain boundary in an yttria-stabilized cubic zirconia bicrystal,” Philosophical Magazine Letters, 82[7], 393-400(2002).
[26] R. Teranishi, H. Fuji, T. Honjo, Y. Nakamura, T. Izumi, Y. Shiohara, J. Shibata, T. Yamamoto, Y. Ikuhara, and M. Yoshimura, “Growth mechanism of Y123 film by MOD-TFA process,” Physica C-Superconductivity and Its Applications, 378, 1033-1038(2002).
[27] Y. Tsuru, Y. Yashima, A. Sawata, Y. Murakami, and Y. Ikuhara, “Influence of SiO2 and Fe2O3 on properties and microstructure of beta ''-alumina,” Journal of the Ceramic Society of Japan, 110[2], 102-107(2002).
[28] T. Watanabe, H. Yoshida, Y. Ikuhara, T. Sakuma, H. Muto, and M. Sakai, “Grain boundary sliding and atomic structures in alumina bicrystals with 0001 symmetric tilt grain boundaries,” Materials Transactions, 43[7], 1561-1565(2002).
[29] T. Yamamoto, F. Oba, Y. Ikuhara, and T. Sakuma, “Current-voltage characteristics across small angle symmetric tilt boundaries in Nb-doped SrTiO3 bicrystals,” Materials Transactions, 43[7], 1537-1541(2002).
[30] H. Yoshida, Y. Ikuhara, and T. Sakuma, “Grain boundary electronic structure related to the hightemperature creep resistance in polycrystalline Al2O3,” Acta Materialia, 50[11], 2955-2966(2002).
[31] H. Yoshida, Y. Takigawa, Y. Ikuhara, and T. Sakuma, “Effect of chemical bonding state on high-temperature plastic flow behavior in fine-grained, polycrystalline cation-doped Al2O3,” Materials Transactions, 43[7], 1566-1572(2002).
[32] H. Yoshida, T. Yamamoto, Y. Ikuhara, and T. Sakuma, “A change in the chemical bonding strength and high-temperature creep resistance in Al2O3 with lanthanoid oxide doping,” Philosophical Magazine a-Physics of Condensed Matter Structure Defects and Mechanical Properties, 82[3], 511-525(2002).
[33] G. D. Zhan, Y. Ikuhara, M. Mitomo, R. J. Xie, T. Sakuma, and A. K. Mukherjee, “Microstructural analysis of liquid-phase-sintered beta-silicon carbide,” Journal of the American Ceramic Society, 85[2], 430-436(2002).