1998年 学術論文
[1]
J. A. Hines, Y. Ikuhara, A. H. Chokshi, and T. Sakuma, “The
influence of trace impurities on the mechanical characteristics
of a superplastic 2 mol% yttria stabilized zirconia,” Acta
Materialia, 46[15],
5557-5568(1998).
[2]
D. X. Huang, Y. Ikuhara, M. Narisawa, and K. Okamura,
“Characterization of beta-silicon carbide powders synthesized by
the carbothermal reduction of silicon carbide precursors,” Journal
of the American Ceramic Society, 81[12],
3173-3176(1998).
[3]
D. X. Huang, Y. Sasaki, S. Okayasu, T. Aruga, K. Hojou, and Y.
Ikuhara, “Damage morphology along ion traces in Au-irradiated
Bi2Sr2CaCu2Ox,” Physical
Review B, 57[21],
13907-13914(1998).
[4]
Y. Ikuhara, and P. Pirouz, “High resolution transmission electron
microscopy studies of metal/ceramics interfaces,” Microscopy
Research and Technique, 40[3],
206-241(1998).
[5]
A. Jaroenworaluck, T. Yamamoto, Y. Ikuhara, T. Sakuma, T. Taniuchi,
K. Okada, and T. Tanase, “Segregation of vanadium at the WC/Co
interface in VC-doped WC-Co,” Journal
of Materials Research, 13[9],
2450-2452(1998).
[6]
Y. Kamagai, Y. Yoshida, M. Iwata, M. Hasegawa, Y. Sugawara, T.
Hirayama, Y. Ikuhara, I. Hirabayashi, and Y. Takai, “Fabrication
and characterization of Nd1+xBa2-xCu3O7-gamma thin films
deposited by metal-organic chemical vapor deposition using
liquid state sources,”Physica C, 304[1-2],
35-42(1998).
[7]
J. Katamura, N. Shibata, Y. Ikuhara, and T. Sakuma, “Transmission
electron microscopy-energy-dispersive X-ray spectroscopy
analysis of the modulated structure in ZrO2-6 mol% Y2O3 alloy,” Philosophical
Magazine Letters, 78[1],
45-49(1998).
[8]
N. Kataoka, K. Hayashi, T. Yamamoto, Y. Sugawara, Y. Ikuhara, and
T. Sakuma, “Direct observation of the double Schottky barrier in
niobium-doped barium titanate by the charge-collection current
method,” Journal
of the American Ceramic Society, 81[7],
1961-1963(1998).
[9]
T. Kondo, Y. Takigawa, Y. Ikuhara, and T. Sakuma, “Critical
assessments of tensile ductility in superplastic TZP and
TiO2-doped TZP,”Materials Transactions Jim, 39[11],
1108-1114(1998).
[10]
M. Kusunoki, M. Rokkaku, Y. Ikuhara, and H. Yanagida, “TEM study on
stability of Mg-doped gamma-alumina fine particles,” Materials
Transactions Jim, 39[1],
110-113(1998).
[11]
X. L. Ma, T. Hirayama, K. Yamagiwa, I. Hirabayashi, and Y. Ikuhara,
“Microstructure characterization of YBa2Cu3O7-y thin film
derived from the metal (Y, Ba, and Cu) naphthenates gels coated
on the SrTiO3 (100) substrate,” Physica
C, 306[3-4],
245-252(1998).
[12]
H. Ogawa, A. Yasuda, N. Shibata, Y. Ikuhara, and T. Sakuma,
“Segregation of yttrium ions to domain boundaries of tetragonal
zirconia,”Philosophical Magazine Letters, 77[4],
199-203(1998).
[13]
S. Okubo, N. Shibata, T. Saito, and Y. Ikuhara, “Formation of
cubic-AlN layer on MgO(100) substrate,” Journal
of Crystal Growth, 189,
452-456(1998).
[14]
M. Okui, T. Saitou, Y. Ishikawa, N. Shibata, and Y. Ikuhara, “High
resolution TEM observation of Si nanoparticle interfaces
fabricated by SIMOX,” Journal
of the Ceramic Society of Japan, 106[12],
1255-1258(1998).
[15]
P. Pirouz, F. Ernst, and Y. Ikuhara, “On epitaxy and orientation
relationships in bicrystals,” Solid
State Phenomena, 60,
51-62(1998).
[16]
Y. Sakaida, K. Tanaka, Y. Ikuhara, and K. Suzuki, “X-ray study of
residual stress distribution of ground ceramics,” Jsme
International Journal Series a-Solid Mechanics and Material
Engineering, 41[3],
422-429(1998).
[17]
T. Suzuki, D. Huang, and Y. Ikuhara, “Microstructures and grain
boundaries of(Ti,Al)N films,” Surface
& Coatings Technology, 107[1],
41-47(1998).
[18]
M. Tagami, M. Nakamura, Y. Sugawara, Y. Ikuhara, and Y. Shiohara,
“Interface structures of heteroepitaxially grown Pr123/Y123 and
Pr123/Nd123 crystals by liquid phase epitaxy,” Physica
C, 298[3-4],
185-194(1998).
[19]
P. Thavorniti, Y. Ikuhara, and T. Sakuma, “Microstructural
characterization of superplastic SiO2-doped TZP with a small
amount of oxide addition,” Journal
of the American Ceramic Society, 81[11],
2927-2932(1998).
[20]
T. Watanabe, Y. Ikuhara, and T. Sakuma, “Evaluation of atomic grain
boundary structure in alumina by molecular orbital method,” Journal
of the Ceramic Society of Japan, 106[9],
888-892(1998).
[21]
T. Yamamoto, Y. Ikuhara, K. Hayashi, and T. Sakuma, “Grain boundary
structure in TiO2 excess barium titanate,” Journal
of Materials Research, 13[12],
3449-3452(1998).
[22]
Y. Yasutomi, Y. Sakaida, N. Hirosaki, and Y. Ikuhara, “Analysis of
crystallographic orientation of elongated beta-Si3N4 particles
in in situ Si3N4 composite by electron back scattered
diffraction method,” Journal
of the Ceramic Society of Japan, 106[10],
980-983(1998).
[23]
H. Yoshida, Y. Ikuhara, and T. Sakuma, “High-temperature creep
resistance in rare-earth-doped, fine-grained Al2O3,” Journal
of Materials Research, 13[9],
2597-2601(1998).
[24]
J. Zhao, Y. Ikuhara, and T. Sakuma, “Grain growth of silica-added
zirconia annealed in the cubic/tetragonal two-phase region,” Journal
of the American Ceramic Society, 81[8],
2087-2092(1998). |
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