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[1] K. Hayashi, T. Yamamoto, Y. Ikuhara, and T. Sakuma, “Grain boundary electrical barriers in positive temperature coefficient thermistors,” Journal of Applied Physics, 86[5], 2909-2913(1999).
[2] N. Hirosaki, T. Saito, F. Munakata, Y. Akimune, and Y. Ikuhara, “Transmission electron microscopy observation of second-phase particles in beta-Si3N4 grains,” Journal of Materials Research, 14[7], 2959-2965(1999).
[3] D. X. Huang, Y. Sasaki, and Y. Ikuhara, “Influence of ion velocity on damage efficiency in the single ion-target irradiation system: Au-Bi2Sr2CaCu2Ox,” Physical Review B, 59[5], 3862-3869(1999).
[4] Y. Ikuhara, Y. Nagai, T. Yamamoto, and T. Sakuma, “High-temperature behavior of SiO2 at grain boundaries in TZP,” Interface Science, 7[2], 77-84(1999).
[5] X. L. Ma, J. Shibata, T. Hirayama, K. Yamagiwa, I. Hirabayashi, and Y. Ikuhara, “Characterization of YbBa2Cu3O7-y superconducting thin films prepared by chemical solution deposition on SrTiO3(001) and LaAlO3(001) substrates,” Physica Status Solidi a-Applied Research, 173[2], 441-450(1999).
[6] X. L. Ma, N. Shibata, and Y. Ikuhara, “Interface characterization of AlN/TiN/MgO(001) prepared by molecular beam epitaxy,” Journal of Materials Research, 14[4], 1597-1603(1999).
[7] X. L. Ma, Y. Sugawara, N. Shibata, and Y. Ikuhara, “Interface structure of AlN/TiN/MgO(001) prepared by molecular beam epitaxy,” Journal of Materials Research, 14[12], 4685-4689(1999).
[8] X. L. Ma, K. Yamagiwa, J. Shibata, T. Hirayama, I. Hirabayashi, and Y. Ikuhara, “Characterization of the YbBa2Cu3O7-y and YBa2Cu3O7-y thin superconducting films prepared by chemical solution deposition on MgO(001) substrate,” Journal of Electron Microscopy, 48[6], 785-789(1999).
[9] J. Mimurada, K. Sasaki, Y. Ikuhara, and T. Sakuma, “Superplastic behavior in GeO2 doped Y-TZP,” Materials Transactions Jim, 40[8], 836-841(1999).
[10] J. Shibata, K. Yamagiwa, I. Hirabayashi, X. L. Ma, J. Yuan, T. Hirayama, and Y. Ikuhara, “Effects of the initial heat-treatment conditions on microstructures of YbBa2Cu3O7-delta superconducting final films deposited on SrTiO3(001) substrates by the dipping-pyrolysis process,”Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, 38[9A], 5050-5053(1999).
[11] H. Suzuki, K. Yonemitsu, T. Saito, and Y. Ikuhara, “Microstructure and composition of Au/Si3N4 model interface,” Journal of the Ceramic Society of Japan, 107[12], 1193-1195(1999).
[12] Y. Takigawa, Y. Ikuhara, and T. Sakuma, “Grain boundary bonding state and fracture energy in small amount of oxide-doped fine-grained Al2O3,” Journal of Materials Science, 34[9], 1991-1997(1999).
[13] T. Yamamoto, K. Hayashi, Y. Ikuhara, and T. Sakuma, “Chemical bonding state at grain boundaries in BaTiO3 doped with a small amount of cation,” Philosophical Magazine Letters, 79[6], 327-331(1999).
[14] T. Yamamoto, A. Jaroenworaluck, Y. Ikuhara, and T. Sakuma, “Nanoprobe analysis of core-rim structure of carbides in TiC-20 wt% Mo2C-20 wt% Ni cermet,” Journal of Materials Research, 14[11], 4129-4131(1999).
[15] H. Yoshida, Y. Ikuhara, and T. Sakuma, “High-temperature creep resistance in lanthanoid ion-doped polycrystalline Al2O3,” Philosophical Magazine Letters, 79[5], 249-256(1999).
[16] H. Yoshida, Y. Ikuhara, and T. Sakuma, “Improvement of creep resistance in polycrystalline Al2O3 by Lu-doping,” International Journal of Inorganic Materials, 1[3-4], 229-234(1999).
[17] J. Yuan, T. Hirayama, Y. Ikuhara, and T. Sakuma, “Electron energy loss spectroscopy study of cerium stabilised zirconia: an application of valence determination in rare earth systems,” Micron, 30[2], 141-145(1999).