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1998年 学術論文

[1]  J. A. Hines, Y. Ikuhara, A. H. Chokshi, and T. Sakuma, “The influence of trace impurities on the mechanical characteristics of a superplastic 2 mol% yttria stabilized zirconia,” Acta Materialia, 46[15], 5557-5568(1998).

[2]  D. X. Huang, Y. Ikuhara, M. Narisawa, and K. Okamura, “Characterization of beta-silicon carbide powders synthesized by the carbothermal reduction of silicon carbide precursors,” Journal of the American Ceramic Society, 81[12], 3173-3176(1998).

[3]  D. X. Huang, Y. Sasaki, S. Okayasu, T. Aruga, K. Hojou, and Y. Ikuhara, “Damage morphology along ion traces in Au-irradiated Bi2Sr2CaCu2Ox,” Physical Review B, 57[21], 13907-13914(1998).

[4]  Y. Ikuhara, and P. Pirouz, “High resolution transmission electron microscopy studies of metal/ceramics interfaces,” Microscopy Research and Technique, 40[3], 206-241(1998).

[5]  A. Jaroenworaluck, T. Yamamoto, Y. Ikuhara, T. Sakuma, T. Taniuchi, K. Okada, and T. Tanase, “Segregation of vanadium at the WC/Co interface in VC-doped WC-Co,” Journal of Materials Research, 13[9], 2450-2452(1998).

[6]  Y. Kamagai, Y. Yoshida, M. Iwata, M. Hasegawa, Y. Sugawara, T. Hirayama, Y. Ikuhara, I. Hirabayashi, and Y. Takai, “Fabrication and characterization of Nd1+xBa2-xCu3O7-gamma thin films deposited by metal-organic chemical vapor deposition using liquid state sources,”Physica C, 304[1-2], 35-42(1998).

[7]  J. Katamura, N. Shibata, Y. Ikuhara, and T. Sakuma, “Transmission electron microscopy-energy-dispersive X-ray spectroscopy analysis of the modulated structure in ZrO2-6 mol% Y2O3 alloy,” Philosophical Magazine Letters, 78[1], 45-49(1998).

[8]  N. Kataoka, K. Hayashi, T. Yamamoto, Y. Sugawara, Y. Ikuhara, and T. Sakuma, “Direct observation of the double Schottky barrier in niobium-doped barium titanate by the charge-collection current method,” Journal of the American Ceramic Society, 81[7], 1961-1963(1998).

[9]  T. Kondo, Y. Takigawa, Y. Ikuhara, and T. Sakuma, “Critical assessments of tensile ductility in superplastic TZP and TiO2-doped TZP,”Materials Transactions Jim, 39[11], 1108-1114(1998).

[10]   M. Kusunoki, M. Rokkaku, Y. Ikuhara, and H. Yanagida, “TEM study on stability of Mg-doped gamma-alumina fine particles,” Materials Transactions Jim, 39[1], 110-113(1998).

[11]   X. L. Ma, T. Hirayama, K. Yamagiwa, I. Hirabayashi, and Y. Ikuhara, “Microstructure characterization of YBa2Cu3O7-y thin film derived from the metal (Y, Ba, and Cu) naphthenates gels coated on the SrTiO3 (100) substrate,” Physica C, 306[3-4], 245-252(1998).

[12]   H. Ogawa, A. Yasuda, N. Shibata, Y. Ikuhara, and T. Sakuma, “Segregation of yttrium ions to domain boundaries of tetragonal zirconia,”Philosophical Magazine Letters, 77[4], 199-203(1998).

[13]   S. Okubo, N. Shibata, T. Saito, and Y. Ikuhara, “Formation of cubic-AlN layer on MgO(100) substrate,” Journal of Crystal Growth, 189, 452-456(1998).

[14]   M. Okui, T. Saitou, Y. Ishikawa, N. Shibata, and Y. Ikuhara, “High resolution TEM observation of Si nanoparticle interfaces fabricated by SIMOX,” Journal of the Ceramic Society of Japan, 106[12], 1255-1258(1998).

[15]   P. Pirouz, F. Ernst, and Y. Ikuhara, “On epitaxy and orientation relationships in bicrystals,” Solid State Phenomena, 60, 51-62(1998).

[16]   Y. Sakaida, K. Tanaka, Y. Ikuhara, and K. Suzuki, “X-ray study of residual stress distribution of ground ceramics,” Jsme International Journal Series a-Solid Mechanics and Material Engineering, 41[3], 422-429(1998).

[17]   T. Suzuki, D. Huang, and Y. Ikuhara, “Microstructures and grain boundaries of(Ti,Al)N films,” Surface & Coatings Technology, 107[1], 41-47(1998).

[18]   M. Tagami, M. Nakamura, Y. Sugawara, Y. Ikuhara, and Y. Shiohara, “Interface structures of heteroepitaxially grown Pr123/Y123 and Pr123/Nd123 crystals by liquid phase epitaxy,” Physica C, 298[3-4], 185-194(1998).

[19]   P. Thavorniti, Y. Ikuhara, and T. Sakuma, “Microstructural characterization of superplastic SiO2-doped TZP with a small amount of oxide addition,” Journal of the American Ceramic Society, 81[11], 2927-2932(1998).

[20]   T. Watanabe, Y. Ikuhara, and T. Sakuma, “Evaluation of atomic grain boundary structure in alumina by molecular orbital method,” Journal of the Ceramic Society of Japan, 106[9], 888-892(1998).

[21]   T. Yamamoto, Y. Ikuhara, K. Hayashi, and T. Sakuma, “Grain boundary structure in TiO2 excess barium titanate,” Journal of Materials Research, 13[12], 3449-3452(1998).

[22]   Y. Yasutomi, Y. Sakaida, N. Hirosaki, and Y. Ikuhara, “Analysis of crystallographic orientation of elongated beta-Si3N4 particles in in situ Si3N4 composite by electron back scattered diffraction method,” Journal of the Ceramic Society of Japan, 106[10], 980-983(1998).

[23]   H. Yoshida, Y. Ikuhara, and T. Sakuma, “High-temperature creep resistance in rare-earth-doped, fine-grained Al2O3,” Journal of Materials Research, 13[9], 2597-2601(1998).

[24]   J. Zhao, Y. Ikuhara, and T. Sakuma, “Grain growth of silica-added zirconia annealed in the cubic/tetragonal two-phase region,” Journal of the American Ceramic Society, 81[8], 2087-2092(1998).